Line Profile and Microstructure Analysis using Powder Diffraction
From February 10, 2017 08:30 until February 10, 2017 17:00 Save to calendar
Posted by Nick Sharp-Paul
Categories: Events in Australia
Australian Synchrotron’s Powder Diffraction team, in conjunction with the Australian X-ray Analytical Association (AXAA) are excited to welcome Professor Matteo Leoni from the University of Trento, an expert in Line Profile Analysis (LPA), to run the one-day workshop Line Profile and Microstructure Analysis using Powder Diffraction. Professor Leoni was part of the team that wrote the software package PM2K that provides modern analysis methods for line profile and microstructure analysis.
The analysis of X-ray powder diffraction data can reveal important information about microstructure such as crystallite size and strain, which have been traditionally characterised using models with very limited application due to assumptions made during their derivation. These assumptions can often misrepresent the sample analysis leading to poor model agreement and in worse cases, inaccurate results and reporting. Modern microstructural analysis methods use more sophisticated mathematical models to describe a range of observed phenomena in X-ray powder diffraction data such as peak broadening due to small crystallite size, micro-strain, combined size/strain effects, stacking faults, anti-phase boundaries and grain surface relaxation.
The Line Profile and Microstructure Analysis using Powder Diffraction workshop is aimed at the moderate-to-advanced powder diffraction analysis user who is required to model complex microstructural effects. The single day event will consist of lectures and hands-on tutorials where participants are encouraged to bring their own data.
Visit the event page for more information on accommodation, catering and computer requirements; for more information please email Dr Justin Kimpton at email@example.com
Registration is free, but numbers will be limited. Please complete the registration form if you are interested in attending.
Preference will be given to those who register for the Australian X-ray Analytical Association 2017 (AXAA 2017) conference, Sunday 5 to Thursday 9 February 2017 at the Pullman Albert Park in Melbourne, immediately before this workshop. If registering for AXAA 2017 enter ‘LPM20” to receive a 20% discount on the AXAA-2017 registration fee.
Please register by Thursday 20 December, 2016. All applicants will be informed on Wednesday 4 January 2017 whether they have been successful.